# title
Delay Wrapper Register Requiring Only One Register and One Scan Enable

# topic.label
Delay Wrapper Register Requiring Only One Register and One Scan Enable Research Paper

# metadata.contentDescription
Testing a device at-speed has become a necessity in very deep sub-micron (VDSM) devices. There are two popular ways to test a device at the top functional speed. The first way is with functional patterns. It is very difficult to apply functional patterns to an embedded core as all of the ports must be available at the chip level or extra test infrastructure must be added. The second way is to use structural (scan) tests. With a combination of transition delay and path delay testing, the delay test coverage can be much higher than with functional tests.