# title
Impact of Technology and Voltage Scaling on theSoft Error Susceptibility in Nanoscale CMOS

# topic.label
Impact of Technology and Voltage Scaling on theSoft Error Susceptibility in Nanoscale CMOS Research paper

# metadata.contentDescription
This paper shows that in sub-65nm technology nodes with aggressive voltage scaling, it is equally critical to solve the soft error problems in logic (latches, flip-flops) as it is in SRAMs.